Poster Fri, Sep 11, 2026 • 7:00 AM – 9:00 AM PDT ExHall # 353

CountEx: Fine-Grained Counting via Exemplars and Exclusion

Yifeng Huang ⋅ Gia Khanh Nguyen ⋅ Minh Hoai Nguyen

Keywords: Recognition, Tracking, Re-ID & Anomaly Detection